"The Dark Side: Security and Reliability Concerns in Machine Learning for EDA."

Zhiyao Xie et al. (2023)

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DOI: 10.1109/TCAD.2022.3199172

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type: Journal Article

metadata version: 2023-08-28

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Zhiyao Xie, Jingyu Pan, Chen-Chia Chang, Jiang Hu, Yiran Chen:
The Dark Side: Security and Reliability Concerns in Machine Learning for EDA. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 42(4): 1171-1184 (2023)

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