"High-level test compaction techniques."

Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha (2002)

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DOI: 10.1109/TCAD.2002.1013895

access: closed

type: Journal Article

metadata version: 2020-09-24

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Srivaths Ravi, Ganesh Lakshminarayana, Niraj K. Jha:
High-level test compaction techniques. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. 21(7): 827-841 (2002)

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