"The Complexity of Fault Detection Problems for Combinational Logic Circuits."

Hideo Fujiwara, Shunichi Toida (1982)

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DOI: 10.1109/TC.1982.1676041

access: closed

type: Journal Article

metadata version: 2017-05-20

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Hideo Fujiwara, Shunichi Toida:
The Complexity of Fault Detection Problems for Combinational Logic Circuits. IEEE Trans. Computers 31(6): 555-560 (1982)

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