"Trial and error: A hierarchical modeling approach to test-retest reliability."

Gang Chen et al. (2021)

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DOI: 10.1016/J.NEUROIMAGE.2021.118647

access: open

type: Journal Article

metadata version: 2022-01-11

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Gang Chen, Daniel S. Pine, Melissa A. Brotman, Ashley R. Smith, Robert W. Cox, Simone P. Haller:
Trial and error: A hierarchical modeling approach to test-retest reliability. NeuroImage 245: 118647 (2021)

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