BibTeX record journals/mr/TangCBWDLTKBTW14

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@article{DBLP:journals/mr/TangCBWDLTKBTW14,
  author       = {Baojun Tang and
                  Kris Croes and
                  Yohan Barbarin and
                  Yunqi Wang and
                  Robin Degraeve and
                  Yunlong Li and
                  Maria Toledano{-}Luque and
                  Thomas Kauerauf and
                  J{\"{u}}rgen B{\"{o}}mmels and
                  Zsolt T{\"{o}}kei and
                  Ingrid De Wolf},
  title        = {As-grown donor-like traps in low-k dielectrics and their impact on
                  intrinsic {TDDB} reliability},
  journal      = {Microelectron. Reliab.},
  volume       = {54},
  number       = {9-10},
  pages        = {1675--1679},
  year         = {2014},
  url          = {https://doi.org/10.1016/j.microrel.2014.07.089},
  doi          = {10.1016/J.MICROREL.2014.07.089},
  timestamp    = {Sun, 04 Aug 2024 19:50:27 +0200},
  biburl       = {https://dblp.org/rec/journals/mr/TangCBWDLTKBTW14.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}