BibTeX record journals/mr/SuMWWP11

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@article{DBLP:journals/mr/SuMWWP11,
  author       = {Fei Su and
                  Ronghai Mao and
                  Xiaoyan Wang and
                  Guangzhou Wang and
                  Haiyan Pan},
  title        = {Creep behaviour of Sn-3.8Ag-0.7Cu under the effect of electromigration:
                  Experiments and modelling},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {5},
  pages        = {1020--1024},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.01.010},
  doi          = {10.1016/J.MICROREL.2011.01.010},
  timestamp    = {Sat, 22 Feb 2020 19:26:45 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/SuMWWP11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}