Hot-carrier-induced degradation of drain current hysteresis and transients in thin gate oxide floating body partially depleted SOI nMOSFETs. - Rafí, Joan Marc; Simoen, Eddy; Hayama, Kiyoteru; Mercha, Abdelkarim; Campabadal, Francesca; Ohyama, Hidenori; Claeys, Cor (Microelectron. Reliab., 2006)