BibTeX record journals/mr/LiuKDDSZ09

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@article{DBLP:journals/mr/LiuKDDSZ09,
  author       = {Y. Liu and
                  F. J. H. G. Kessels and
                  Willem D. van Driel and
                  J. A. S. van Driel and
                  F. L. Sun and
                  G. Q. Zhang},
  title        = {Comparing drop impact test method using strain gauge measurements},
  journal      = {Microelectron. Reliab.},
  volume       = {49},
  number       = {9-11},
  pages        = {1299--1303},
  year         = {2009},
  url          = {https://doi.org/10.1016/j.microrel.2009.07.008},
  doi          = {10.1016/J.MICROREL.2009.07.008},
  timestamp    = {Sat, 22 Feb 2020 19:27:52 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/LiuKDDSZ09.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}