"Impact of work function of the silicon bottom-gates on electrical ..."

Hyun Jun Jang, Chong-Gun Yu, Jong Tae Park (2016)

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DOI: 10.1016/J.MICROREL.2016.07.010

access: closed

type: Journal Article

metadata version: 2022-10-02

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Hyun Jun Jang, Chong-Gun Yu, Jong Tae Park:
Impact of work function of the silicon bottom-gates on electrical instability in InGaZnO thin film transistors. Microelectron. Reliab. 64: 570-574 (2016)

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