BibTeX record journals/mr/GalyBJJMD11

• > Home > journals/mr/GalyBJJMD11

@article{DBLP:journals/mr/GalyBJJMD11,
  author       = {Philippe Galy and
                  J. Bourgeat and
                  Jean Jimenez and
                  Blaise Jacquier and
                  D. Marin{-}Cudraz and
                  Sylvain Dudit},
  title        = {Reliability impact due to high current, lattice and hot carriers temperatures
                  on {\(\beta\)}\({}^{\mbox{(2{\texttimes}2)}}\) matrix {ESD} power
                  devices for advanced {CMOS} technologies},
  journal      = {Microelectron. Reliab.},
  volume       = {51},
  number       = {9-11},
  pages        = {1608--1613},
  year         = {2011},
  url          = {https://doi.org/10.1016/j.microrel.2011.07.046},
  doi          = {10.1016/J.MICROREL.2011.07.046},
  timestamp    = {Sat, 22 Feb 2020 19:28:01 +0100},
  biburl       = {https://dblp.org/rec/journals/mr/GalyBJJMD11.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}