"Low frequency noise in 0.12 mum partially and fully depleted SOI technology."

François Dieudonné et al. (2003)

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DOI: 10.1016/S0026-2714(02)00279-2

access: closed

type: Journal Article

metadata version: 2020-02-22

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François Dieudonné, Sébastien Haendler, Jalal Jomaah, Francis Balestra:
Low frequency noise in 0.12 mum partially and fully depleted SOI technology. Microelectron. Reliab. 43(2): 243-248 (2003)

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