"Layered critical values: a powerful direct-adjustment approach to ..."

Geoffrey I. Webb (2008)

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DOI: 10.1007/S10994-008-5046-X

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type: Journal Article

metadata version: 2020-03-02

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Geoffrey I. Webb:
Layered critical values: a powerful direct-adjustment approach to discovering significant patterns. Mach. Learn. 71(2-3): 307-323 (2008)

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