"An efficient architecture for accumulator-based test generation of SIC pairs."

Ioannis Voyiatzis, Costas Efstathiou (2010)

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DOI: 10.1016/J.MEJO.2009.05.003

access: closed

type: Journal Article

metadata version: 2020-02-22

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Ioannis Voyiatzis, Costas Efstathiou:
An efficient architecture for accumulator-based test generation of SIC pairs. Microelectron. J. 41(8): 487-493 (2010)

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