"Structured Design for Testability in Semicustom VLSI."

James H. Aylor, Barry W. Johnson, Bruce J. Rector (1986)

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DOI: 10.1109/MM.1986.304637

access: closed

type: Journal Article

metadata version: 2017-05-20

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James H. Aylor, Barry W. Johnson, Bruce J. Rector:
Structured Design for Testability in Semicustom VLSI. IEEE Micro 6(1): 51-58 (1986)

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