"A differential built-in current sensor design for high-speed IDDQ testing."

Jason P. Hurst, Adit D. Singh (1997)

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DOI: 10.1109/4.553192

access: closed

type: Journal Article

metadata version: 2022-07-07

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Jason P. Hurst, Adit D. Singh:
A differential built-in current sensor design for high-speed IDDQ testing. IEEE J. Solid State Circuits 32(1): 122-125 (1997)

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