"Semi supervised inspection algorithm of automatic packaging curve based on ..."

Yong He (2022)

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DOI: 10.3233/JCM-215690

access: closed

type: Journal Article

metadata version: 2022-04-27

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Yong He:
Semi supervised inspection algorithm of automatic packaging curve based on deep learning. J. Comput. Methods Sci. Eng. 22(2): 363-372 (2022)

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