"Chip test pattern reordering method using adaptive test to reduce cost for ..."

Tai Song et al. (2021)

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DOI: 10.1587/ELEX.17.20200420

access: open

type: Journal Article

metadata version: 2022-12-07

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Tai Song, Huaguo Liang, Zhengfeng Huang, Tianming Ni, Ying Sun:
Chip test pattern reordering method using adaptive test to reduce cost for testing of ICs. IEICE Electron. Express 18(2): 20200420 (2021)

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