"Reducing Average and Peak Test Power Through Scan Chain Modification."

Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu (2003)

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DOI: 10.1023/A:1024600311740

access: closed

type: Journal Article

metadata version: 2020-12-29

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Ozgur Sinanoglu, Ismet Bayraktaroglu, Alex Orailoglu:
Reducing Average and Peak Test Power Through Scan Chain Modification. J. Electron. Test. 19(4): 457-467 (2003)

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