"A Novel RF Test Scheme Based on a DFT Method."

Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla (2006)

> Home

Details and statistics

DOI: 10.1007/S10836-006-7823-4

access: closed

type: Journal Article

metadata version: 2020-09-11

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/RyuKS06
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/RyuKS06
Jee-Youl Ryu, Bruce C. Kim, Iboun Taimiya Sylla:
A Novel RF Test Scheme Based on a DFT Method. J. Electron. Test. 22(3): 229-237 (2006)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.