BibTeX record journals/et/KarelACGR19

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@article{DBLP:journals/et/KarelACGR19,
  author       = {Amit Karel and
                  Florence Aza{\"{\i}}s and
                  Mariane Comte and
                  Jean{-}Marc Galli{\`{e}}re and
                  Michel Renovell},
  title        = {Analytical Models for the Evaluation of Resistive Short Defect Detectability
                  in Presence of Process Variations: Application to 28nm Bulk and {FDSOI}
                  Technologies},
  journal      = {J. Electron. Test.},
  volume       = {35},
  number       = {1},
  pages        = {59--75},
  year         = {2019},
  url          = {https://doi.org/10.1007/s10836-019-05776-1},
  doi          = {10.1007/S10836-019-05776-1},
  timestamp    = {Sun, 19 Jan 2025 14:19:40 +0100},
  biburl       = {https://dblp.org/rec/journals/et/KarelACGR19.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}