"Analytical Models for the Evaluation of Resistive Short Defect ..."

Amit Karel et al. (2019)

> Home

Details and statistics

DOI: 10.1007/S10836-019-05776-1

access: closed

type: Journal Article

metadata version: 2025-01-19

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - journals/et/KarelACGR19
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/journals/et/KarelACGR19
Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell:
Analytical Models for the Evaluation of Resistive Short Defect Detectability in Presence of Process Variations: Application to 28nm Bulk and FDSOI Technologies. J. Electron. Test. 35(1): 59-75 (2019)

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.