"A Comprehensive Framework for Counterfeit Defect Coverage Analysis and ..."

Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor (2014)

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DOI: 10.1007/S10836-013-5428-2

access: closed

type: Journal Article

metadata version: 2020-09-11

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Ujjwal Guin, Daniel DiMase, Mohammad Tehranipoor:
A Comprehensive Framework for Counterfeit Defect Coverage Analysis and Detection Assessment. J. Electron. Test. 30(1): 25-40 (2014)

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