"Features of a Scan and Clock Resource chip for providing access to ..."

Bulent I. Dervisoglu (1991)

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DOI: 10.1007/BF00134947

access: closed

type: Journal Article

metadata version: 2020-09-11

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Bulent I. Dervisoglu:
Features of a Scan and Clock Resource chip for providing access to board-level test functions. J. Electron. Test. 2(1): 107-115 (1991)

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