"Modeling Fault Coverage of Random Test Patterns."

Hailong Cui, Sharad C. Seth, Shashank K. Mehta (2003)

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DOI: 10.1023/A:1023796929359

access: closed

type: Journal Article

metadata version: 2020-09-11

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Hailong Cui, Sharad C. Seth, Shashank K. Mehta:
Modeling Fault Coverage of Random Test Patterns. J. Electron. Test. 19(3): 271-284 (2003)

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