"Data-Driven Test Plan Augmentation for Platform Verification."

Wen Chen et al. (2017)

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DOI: 10.1109/MDAT.2017.2713390

access: closed

type: Journal Article

metadata version: 2020-03-13

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Wen Chen, Kuo-Kai Hsieh, Li-Chung Wang, Jayanta Bhadra:
Data-Driven Test Plan Augmentation for Platform Verification. IEEE Des. Test 34(5): 23-29 (2017)

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