"How to identify promising chances for technological innovation: ..."

Youngjung Geum, Mirae Kim (2020)

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DOI: 10.1016/J.AEI.2020.101155

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type: Journal Article

metadata version: 2023-06-26

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Youngjung Geum, Mirae Kim:
How to identify promising chances for technological innovation: Keygraph-based patent analysis. Adv. Eng. Informatics 46: 101155 (2020)

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