BibTeX record conf/wacv/HiroiSW02

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@inproceedings{DBLP:conf/wacv/HiroiSW02,
  author       = {Takashi Hiroi and
                  Chie Shishido and
                  Masahiro Watanabe},
  title        = {Pattern Alignment Method Based on Consistency Among Local Registration
                  Candidates for {LSI} Wafer Pattern Inspection},
  booktitle    = {6th {IEEE} Workshop on Applications of Computer Vision {(WACV} 2002),
                  3-4 December 2002, Orlando, FL, {USA}},
  pages        = {257--263},
  publisher    = {{IEEE} Computer Society},
  year         = {2002},
  url          = {https://doi.org/10.1109/ACV.2002.1182191},
  doi          = {10.1109/ACV.2002.1182191},
  timestamp    = {Fri, 24 Mar 2023 00:04:56 +0100},
  biburl       = {https://dblp.org/rec/conf/wacv/HiroiSW02.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}