"An Efficient External Memory Test Solution: Case Study for HPC Application."

Keqing Ouyang et al. (2023)

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DOI: 10.1109/VTS56346.2023.10139991

access: closed

type: Conference or Workshop Paper

metadata version: 2023-06-09

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Keqing Ouyang, Minqiang Peng, Yunnong Zhu, Kang Qi, Grigor Tshagharyan, Arun Kumar, Gurgen Harutyunyan, Isaac Wang:
An Efficient External Memory Test Solution: Case Study for HPC Application. VTS 2023: 1-4

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