"Implementation-Independent Functional Test Generation for MSC Microprocessors."

Adeboye Stephen Oyeniran et al. (2019)

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DOI: 10.1109/VLSI-SOC.2019.8920323

access: closed

type: Conference or Workshop Paper

metadata version: 2020-10-25

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Adeboye Stephen Oyeniran, Raimund Ubar, Maksim Jenihhin, Jaan Raik:
Implementation-Independent Functional Test Generation for MSC Microprocessors. VLSI-SoC 2019: 82-87

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