"CPK Based IO AC Timing Closure to Reduce Yield Loss and Test Time."

Sandip Ghosh, Rohit Srivastava (2013)

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DOI: 10.1007/978-3-642-42024-5_31

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-17

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Sandip Ghosh, Rohit Srivastava:
CPK Based IO AC Timing Closure to Reduce Yield Loss and Test Time. VDAT 2013: 257-266

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