"Gate Merging: An NBTI Mitigation Method to Eliminate Critical Internal ..."

Maryam Ghane, Hamid R. Zarandi (2016)

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DOI: 10.1109/PDP.2016.90

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-24

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Maryam Ghane, Hamid R. Zarandi:
Gate Merging: An NBTI Mitigation Method to Eliminate Critical Internal Nodes in Digital Circuits. PDP 2016: 786-791

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