"Expectation maximization classification and Laplacian based thickness ..."

Mark Holden et al. (2007)

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DOI: 10.1117/12.710510

access: closed

type: Conference or Workshop Paper

metadata version: 2024-11-27

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Mark Holden, Rafael Moreno-Vallecillo, Anthony W. F. Harris, Lavier J. Gomes, Than-Mei Diep, Pierrick T. Bourgeat, Sébastien Ourselin:
Expectation maximization classification and Laplacian based thickness measurement for cerebral cortex thickness estimation. Image Processing 2007: 65120M

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