"Impact of process variations on the detectability of resistive short ..."

Amit Karel et al. (2018)

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DOI: 10.1109/LATW.2018.8349696

access: closed

type: Conference or Workshop Paper

metadata version: 2024-04-19

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Amit Karel, Florence Azaïs, Mariane Comte, Jean-Marc Gallière, Michel Renovell:
Impact of process variations on the detectability of resistive short defects: Comparative analysis between 28nm Bulk and FDSOI technologies. LATS 2018: 1-5

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