"Production Deployment of a Fast Transient Testing Methodology for Analog ..."

Ramakrishna Voorakaranam et al. (2003)

> Home

Details and statistics

DOI: 10.1109/TEST.2003.1271106

access: closed

type: Conference or Workshop Paper

metadata version: 2023-03-23

- view
  authority control:
- export record
  dblp key:
  - conf/itc/VoorakaranamNCCKMC03
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/itc/VoorakaranamNCCKMC03
Ramakrishna Voorakaranam, Randy Newby, Sasikumar Cherubal, Bob Cometta, Thomas Kuehl, David M. Majernik, Abhijit Chatterjee:
Production Deployment of a Fast Transient Testing Methodology for Analog Circuits : Case Study and Results. ITC 2003: 1174-1181

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.