BibTeX record conf/itc/KawagoeONOHH00

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@inproceedings{DBLP:conf/itc/KawagoeONOHH00,
  author       = {Tomoya Kawagoe and
                  Jun Ohtani and
                  Mitsutaka Niiro and
                  Tukasa Ooishi and
                  Mitsuhiro Hamada and
                  Hideto Hidaka},
  title        = {A built-in self-repair analyzer {(CRESTA)} for embedded DRAMs},
  booktitle    = {Proceedings {IEEE} International Test Conference 2000, Atlantic City,
                  NJ, USA, October 2000},
  pages        = {567--574},
  publisher    = {{IEEE} Computer Society},
  year         = {2000},
  url          = {https://doi.org/10.1109/TEST.2000.894250},
  doi          = {10.1109/TEST.2000.894250},
  timestamp    = {Thu, 23 Mar 2023 23:58:41 +0100},
  biburl       = {https://dblp.org/rec/conf/itc/KawagoeONOHH00.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}