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"Realizing High Test Quality Goals with Smart Test Resource Usage."
Xinli Gu et al. (2004)
- Xinli Gu, Cyndee Wang, Abby Lee, Bill Eklow, Kun-Han Tsai, Jan Arild Tofte, Mark Kassab, Janusz Rajski:
Realizing High Test Quality Goals with Smart Test Resource Usage. ITC 2004: 525-533
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