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"Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability ..."
Zhengda Dou et al. (2020)
- Zhengda Dou, Aibin Yan, Jun Zhou, Yuanjie Hu, Yan Chen, Tianming Ni, Jie Cui, Patrick Girard, Xiaoqing Wen:
Design of a Highly Reliable SRAM Cell with Advanced Self-Recoverability from Soft Errors. ITC-Asia 2020: 35-40
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