"An arbitrary stressed NBTI compact model for analog/mixed-signal ..."

Jinbo Wan, Hans G. Kerkhoff (2013)

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DOI: 10.1109/ISQED.2013.6523587

access: closed

type: Conference or Workshop Paper

metadata version: 2017-05-25

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Jinbo Wan, Hans G. Kerkhoff:
An arbitrary stressed NBTI compact model for analog/mixed-signal reliability simulations. ISQED 2013: 31-37

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