"Reliability through modulation diversity: can combining multiple IEEE ..."

Pere Tuset-Peiró et al. (2020)

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DOI: 10.1109/ISCC50000.2020.9219719

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type: Conference or Workshop Paper

metadata version: 2020-10-19

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Pere Tuset-Peiró, Ferran Adelantado, Xavier Vilajosana, Ruan Delgado Gomes:
Reliability through modulation diversity: can combining multiple IEEE 802.15.4-2015 SUN modulations improve PDR? ISCC 2020: 1-6

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