BibTeX record conf/irps/WangXLRSWLCYLWCWJH24

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@inproceedings{DBLP:conf/irps/WangXLRSWLCYLWCWJH24,
  author       = {Da Wang and
                  Yongkang Xue and
                  Yong Liu and
                  Pengpeng Ren and
                  Zixuan Sun and
                  Zirui Wang and
                  Yueyang Liu and
                  Zhijun Cheng and
                  Haiyang Yang and
                  Xiangli Liu and
                  Blacksmith Wu and
                  Kanyu Cao and
                  Runsheng Wang and
                  Zhigang Ji and
                  Ru Huang},
  title        = {Sub-20-nm {DRAM} Technology under Negative Bias Temperature Instability
                  {(NBTI):} from Characterization to Physical Origin Identification},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2024, Grapevine,
                  TX, USA, April 14-18, 2024},
  pages        = {9},
  publisher    = {{IEEE}},
  year         = {2024},
  url          = {https://doi.org/10.1109/IRPS48228.2024.10529451},
  doi          = {10.1109/IRPS48228.2024.10529451},
  timestamp    = {Sun, 04 Aug 2024 19:36:36 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/WangXLRSWLCYLWCWJH24.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}