BibTeX record conf/irps/VaisMFLARSCTHGD15

• > Home > conf/irps/VaisMFLARSCTHGD15

@inproceedings{DBLP:conf/irps/VaisMFLARSCTHGD15,
  author       = {Abhitosh Vais and
                  Koen Martens and
                  Jacopo Franco and
                  Dennis Lin and
                  AliReza Alian and
                  Philippe Roussel and
                  S. Sioncke and
                  Nadine Collaert and
                  Aaron Thean and
                  Marc M. Heyns and
                  Guido Groeseneken and
                  Kristin De Meyer},
  title        = {The relationship between border traps characterized by {AC} admittance
                  and {BTI} in {III-V} {MOS} devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112742},
  doi          = {10.1109/IRPS.2015.7112742},
  timestamp    = {Sun, 06 Oct 2024 21:08:51 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/VaisMFLARSCTHGD15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}