BibTeX record conf/irps/TangCJBTWWM15

• > Home > conf/irps/TangCJBTWWM15

@inproceedings{DBLP:conf/irps/TangCJBTWWM15,
  author       = {Baojun Tang and
                  Kris Croes and
                  Nicolas Jourdan and
                  J{\"{u}}rgen B{\"{o}}mmels and
                  Zsolt T{\"{o}}kei and
                  Ingrid De Wolf and
                  Eric Wilcox and
                  Timothy McMullen},
  title        = {Constant voltage electromigration for advanced {BEOL} copper interconnects},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2015, Monterey,
                  CA, USA, April 19-23, 2015},
  pages        = {2},
  publisher    = {{IEEE}},
  year         = {2015},
  url          = {https://doi.org/10.1109/IRPS.2015.7112685},
  doi          = {10.1109/IRPS.2015.7112685},
  timestamp    = {Wed, 23 Oct 2024 22:44:16 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/TangCJBTWWM15.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}