BibTeX record conf/irps/SinhaBSS20

• > Home > conf/irps/SinhaBSS20

@inproceedings{DBLP:conf/irps/SinhaBSS20,
  author       = {Rajat Sinha and
                  Prasenjit Bhattacharya and
                  Sanjiv Sambandan and
                  Mayank Shrivastava},
  title        = {Threshold Voltage Shift in a-Si: {H} Thin film Transistors under {ESD}
                  stress Conditions},
  booktitle    = {2020 {IEEE} International Reliability Physics Symposium, {IRPS} 2020,
                  Dallas, TX, USA, April 28 - May 30, 2020},
  pages        = {1--6},
  publisher    = {{IEEE}},
  year         = {2020},
  url          = {https://doi.org/10.1109/IRPS45951.2020.9128355},
  doi          = {10.1109/IRPS45951.2020.9128355},
  timestamp    = {Sat, 05 Sep 2020 18:06:30 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/SinhaBSS20.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}