"Investigation of resistance fluctuations in ReRAM: physical origin, ..."

Lucas Reganaz et al. (2023)

> Home

Details and statistics

DOI: 10.1109/IRPS48203.2023.10117882

access: closed

type: Conference or Workshop Paper

metadata version: 2023-08-29

- view
  - electronic edition via DOI
  - unpaywalled version
  authority control:
- export record
  dblp key:
  - conf/irps/ReganazDRLCNBPMA23
- ask others
- share record
  persistent URL:
  - https://dblp.org/rec/conf/irps/ReganazDRLCNBPMA23
Lucas Reganaz, Damien Deleruyelle, Quentin Rafhay, Joel Minguet Lopez, Niccolo Castellani, Jean-François Nodin, Alessandro Bricalli, Giuseppe Piccolboni, Gabriel Molas, François Andrieu:
Investigation of resistance fluctuations in ReRAM: physical origin, temporal dependence and impact on memory reliability. IRPS 2023: 1-6

manage site settings

To protect your privacy, all features that rely on external API calls from your browser are turned off by default. You need to opt-in for them to become active. All settings here will be stored as cookies with your web browser. For more information see our F.A.Q.