BibTeX record conf/irps/MonishmuraliKBS22

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@inproceedings{DBLP:conf/irps/MonishmuraliKBS22,
  author       = {M. Monishmurali and
                  Nagothu Karmel Kranthi and
                  Gianluca Boselli and
                  Mayank Shrivastava},
  title        = {Effect of Source {\&} Drain Side Abutting on the Low Current Filamentation
                  in {LDMOS-SCR} Devices},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {6},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764606},
  doi          = {10.1109/IRPS48227.2022.9764606},
  timestamp    = {Sat, 30 Sep 2023 09:49:38 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/MonishmuraliKBS22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}