Reliability and Variability of Advanced CMOS Devices at Cryogenic Temperatures. - Grill, Alexander; Bury, Erik; Michl, Jakob; Tyaginov, Stanislav; Linten, Dimitri; Grasser, Tibor; Parvais, Bertrand; Kaczer, Ben; Waltl, Michael; Radu, Iuliana P. (2020)