BibTeX record conf/irps/FeilWRBASRGG23

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@inproceedings{DBLP:conf/irps/FeilWRBASRGG23,
  author       = {Maximilian W. Feil and
                  Katja Waschneck and
                  Hans Reisinger and
                  Judith Berens and
                  Thomas Aichinger and
                  Paul Salmen and
                  Gerald Rescher and
                  Wolfgang Gustin and
                  Tibor Grasser},
  title        = {Towards Understanding the Physics of Gate Switching Instability in
                  Silicon Carbide MOSFETs},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2023, Monterey,
                  CA, USA, March 26-30, 2023},
  pages        = {1--10},
  publisher    = {{IEEE}},
  year         = {2023},
  url          = {https://doi.org/10.1109/IRPS48203.2023.10117740},
  doi          = {10.1109/IRPS48203.2023.10117740},
  timestamp    = {Mon, 03 Mar 2025 21:14:31 +0100},
  biburl       = {https://dblp.org/rec/conf/irps/FeilWRBASRGG23.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}