BibTeX record conf/irps/BuryCKVTFRMWHL22

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@inproceedings{DBLP:conf/irps/BuryCKVTFRMWHL22,
  author       = {Erik Bury and
                  Adrian Vaisman Chasin and
                  Ben Kaczer and
                  Michiel Vandemaele and
                  Stanislav Tyaginov and
                  Jacopo Franco and
                  Romain Ritzenthaler and
                  Hans Mertens and
                  Pieter Weckx and
                  N. Horiguchi and
                  Dimitri Linten},
  title        = {Evaluating Forksheet {FET} Reliability Concerns by Experimental Comparison
                  with Co-integrated Nanosheets},
  booktitle    = {{IEEE} International Reliability Physics Symposium, {IRPS} 2022, Dallas,
                  TX, USA, March 27-31, 2022},
  pages        = {5},
  publisher    = {{IEEE}},
  year         = {2022},
  url          = {https://doi.org/10.1109/IRPS48227.2022.9764526},
  doi          = {10.1109/IRPS48227.2022.9764526},
  timestamp    = {Wed, 24 May 2023 09:11:21 +0200},
  biburl       = {https://dblp.org/rec/conf/irps/BuryCKVTFRMWHL22.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}