BibTeX record conf/iolts/BravaixSCFNMKPH16

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@inproceedings{DBLP:conf/iolts/BravaixSCFNMKPH16,
  author       = {Alain Bravaix and
                  M. Saliva and
                  Florian Cacho and
                  X. Federspiel and
                  Cheikh Ndiaye and
                  Souhir Mhira and
                  Edith Kussener and
                  E. Pauly and
                  Vincent Huard},
  title        = {Hot-carrier and {BTI} damage distinction for high performance digital
                  application in 28nm {FDSOI} and 28nm {LP} {CMOS} nodes},
  booktitle    = {22nd {IEEE} International Symposium on On-Line Testing and Robust
                  System Design, {IOLTS} 2016, Sant Feliu de Guixols, Spain, July 4-6,
                  2016},
  pages        = {43--46},
  publisher    = {{IEEE}},
  year         = {2016},
  url          = {https://doi.org/10.1109/IOLTS.2016.7604669},
  doi          = {10.1109/IOLTS.2016.7604669},
  timestamp    = {Sat, 30 Sep 2023 09:49:09 +0200},
  biburl       = {https://dblp.org/rec/conf/iolts/BravaixSCFNMKPH16.bib},
  bibsource    = {dblp computer science bibliography, https://dblp.org}
}