"Repairing Order-Dependent Flaky Tests via Test Generation."

Chengpeng Li et al. (2022)

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DOI: 10.1145/3510003.3510173

access: closed

type: Conference or Workshop Paper

metadata version: 2025-01-19

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Chengpeng Li, Chenguang Zhu, Wenxi Wang, August Shi:
Repairing Order-Dependent Flaky Tests via Test Generation. ICSE 2022: 1881-1892

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